Hafnium (Hf) Sputtering Targets
Shenzhen Sunrise Metal Industry Co.,Ltd
TEL:0086-0755-27185042
Website:http://www.sunriseta.com
E-Mail:sales@sunriseta.com
Specifications
(2N) 99% Hafnium Sputtering Target | Request | |
(2N5) 99.5% Hafnium Sputtering Target | Request | |
(3N) 99.9% Hafnium Sputtering Target | Request | |
(3N5) 99.95% Hafnium Sputtering Target | Request | |
(4N) 99.99% Hafnium Sputtering Target | Request | |
(5N) 99.999% Hafnium Sputtering Target |
Properties
Molecular Weight 178.49
Appearance Silver
Melting Point 2227°C
Boiling Point 4602°C
Density 13.31 g/cm3
Thermal Expansion (25 °C) 5.9 µm·m-1·K-1
Poisson Ratio 0.37
Vickers Hardness 1760 MPa
Young's Modulus 78 GPa
Tensile Strength N/A
Thermal Conductivity 0.230 W/cm/K @ 298.2 K
Electronegativity 1.3 Paulings
Specific Heat 0.035 Cal/g/K @ 25 °C
Heat of Vaporization 155 K-Cal/gm atom at 4602°C
Molecular Weight | 178.49 |
---|---|
Appearance | Silver |
Melting Point | 2227°C |
Boiling Point | 4602°C |
Density | 13.31 g/cm3 |
Thermal Expansion | (25 °C) 5.9 µm·m-1·K-1 |
Poisson Ratio | 0.37 |
Vickers Hardness | 1760 MPa |
Young's Modulus | 78 GPa |
Tensile Strength | N/A |
Thermal Conductivity | 0.230 W/cm/K @ 298.2 K |
Electronegativity | 1.3 Paulings |
Specific Heat | 0.035 Cal/g/K @ 25 °C |
Heat of Vaporization | 155 K-Cal/gm atom at 4602°C |
Material Type Hafnium
Symbol Hf
Atomic Weight 178.49
Atomic Number 72
Color/Appearance Gray Steel, Metallic
Thermal Conductivity 23 W/m.K
Melting Point (°C) 2,227
Coefficient of Thermal Expansion 5.9 x 10-6/K
Theoretical Density (g/cc) 13.09
Z Ratio 0.36
Sputter DC
Max Power Density
(Watts/Square Inch) 50
Type of Bond Indium
Export Control (ECCN) 1C231
Material Type | Hafnium |
Symbol | Hf |
Atomic Weight | 178.49 |
Atomic Number | 72 |
Color/Appearance | Gray Steel, Metallic |
Thermal Conductivity | 23 W/m.K |
Melting Point (°C) | 2,227 |
Coefficient of Thermal Expansion | 5.9 x 10-6/K |
Theoretical Density (g/cc) | 13.09 |
Z Ratio | 0.36 |
Sputter | DC |
Max Power Density (Watts/Square Inch) | 50 |
Type of Bond | Indium |
Export Control (ECCN) | 1C231 |
Z-Factors
Empirical Determination of Z-Factor
Unfortunately, Z Factor and Shear Modulus are not readily available for many materials. In this case, the Z-Factor can also be determined empirically using the following method:
- Deposit material until Crystal Life is near 50%, or near the end of life, whichever is sooner.
- Place a new substrate adjacent to the used quartz sensor.
- Set QCM Density to the calibrated value; Tooling to 100%
- Zero thickness
- Deposit approximately 1000 to 5000 A of material on the substrate.
- Use a profilometer or interferometer to measure the actual substrate film thickness.
- Adjust the Z Factor of the instrument until the correct thickness reading is shown.
Another alternative is to change crystals frequently and ignore the error. The graph below shows the % Error in Rate/Thickness from using the wrong Z Factor. For a crystal with 90% life, the error is negligible for even large errors in the programmed versus actual Z Factor.
NOTE: This is an Export Controlled Material. Restrictions may apply.
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